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Characterization of Nanorod Structure Using Spectroscopic Ellipsometry
N. E. J. Omaghali
(PDF 312K)
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Ellipsometric Study of SiOx Thin Films by Thermal Evaporation
David Salazar,
Roberto Soto-Molina,
Eder German Lizarraga-Medina,
Marco Antonio Felix,
Nicola Radnev,
Heriberto Márquez
(PDF 2509K)
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Error Corrected Sub-Monolayer Ellipsometry for Measurement of Biomolecular Interactions
Udo Riss
(PDF 1231K)
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Optical Constants for MBE n-Type GaAs Films Doped by Si or Te between 1.50-4.75 eV
Svetlana N. Svitasheva
(PDF 259K)
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Spectroscopic Ellipsometry Study of the Dielectric Function of Cu(In
1–x
Ga
x
)
3
Se
5
Bulk Compounds: Identification of Optical Transitions
Dayane Habib,
Georges El Haj Moussa
(PDF 1580K)
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