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Characterization of Nanorod Structure Using Spectroscopic Ellipsometry
N. E. J. Omaghali
Opt. Photonics J.
Vol.6 No.4, April 21, 2016
DOI:
10.4236/opj.2016.64007
(PDF 312K)
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Ellipsometric Study of SiOx Thin Films by Thermal Evaporation
David Salazar,
Roberto Soto-Molina,
Eder German Lizarraga-Medina,
Marco Antonio Felix,
Nicola Radnev,
Heriberto Márquez
Open J. Inorg. Chem.
Vol.6 No.3, July 05, 2016
DOI:
10.4236/ojic.2016.63013
(PDF 2509K)
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Optical Band Gap, Oxidation Polarizability, Optical Basicity and Electronegativity Measurements of Silicate Glasses Using Ellipsometer and Abbe Refractometer
Zahid Hussain
New J. Glass Ceram.
Vol.11 No.1, January 08, 2021
DOI:
10.4236/njgc.2021.111001
(PDF 4048K)
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Error Corrected Sub-Monolayer Ellipsometry for Measurement of Biomolecular Interactions
Udo Riss
Open J. Biophys.
Vol.3 No.1, February 27, 2013
DOI:
10.4236/ojbiphy.2013.31A010
(PDF 1231K)
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Optical Constants for MBE n-Type GaAs Films Doped by Si or Te between 1.50-4.75 eV
Svetlana N. Svitasheva
J. Electromagn. Anal. Appl.
Vol.2 No.6, June 30, 2010
DOI:
10.4236/jemaa.2010.26046
(PDF 259K)
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