"Resistive Switching in Stabilized Zirconia Films Studied by Conductive Atomic Force Microscopy"
published by Journal of Materials Science and Chemical Engineering, Vol.5 No.1, 2017
has been cited by the following article(s):
Conductive Atomic Force Microscopy Study of the Resistive Switching in Yttria-Stabilized Zirconia Films with Au Nanoparticles
Observation of Quantum-Size Effects in a Study of Resistive Switching in Dielectric Films with Au Nanoparticles via Tunneling Atomic Force Microscopy