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Circuits and Systems
ISSN Online: 2153-1293
Google-based IF: 0.88  Citations h5-index & Ranking
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"Review of the Global Trend of Interconnect Reliability for Integrated Circuit"

written by Qian Lin1, Haifeng Wu2, Guoqing Jia1 ,

published by Circuits and Systems, Vol.9 No.2, 2018

has been cited by the following article(s):

 
 
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