"New Analysis to Measure the Capacitance and Conductance of MOS Structure toward Small Size of VLSI Circuits"
Wagah Farman Mohammad
published by Circuits and Systems, Vol.2 No.3, 2011
has been cited by the following article(s):
Caractérisation de Dispositifs MOSFETs Fortement Submicronique par les techniques Courants Tensions I (V)