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Circuits and Systems
ISSN Online: 2153-1293
Google-based IF: 0.88  Citations h5-index & Ranking
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"Influence of Extended Bias Stress on the Electrical Parameters of Mixed Oxide Thin Film Transistors"

written by Winnie P. Mathews, Rajitha N. P. Vemuri, Terry L. Alford ,

published by Circuits and Systems, Vol.3 No.4, 2012

has been cited by the following article(s):

 
 
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