MSA  Vol.2 No.8 , August 2011
Investigation of Polyaniline Thin Film and Schottky Junction with Aluminium for Electrical and Optical Characterization
ABSTRACT
Polyaniline Powdered sample was chemically synthesized using aniline and doped with HCl. Ultra thin film and Schottky junction with Al metal have been fabricated from this powdered sample Ultrathin film of polyaniline shows amorphous nature of the film. Two activation energies of these films at two different temperatures regions within 25-120oC have been observed. Schottky Junction with Al meal shows that the diode ideality factor is much higher than unity. Barrier height of this Schottky junction is estimated to be around 0.61eV. C-V plot of the junction indicates that the carrier concentration is about 1015cm-3. There are various factors found to affect the junction to deviate from ideal Schottky behaviour.

Cite this paper
nullP. Saikia and P. Sarmah, "Investigation of Polyaniline Thin Film and Schottky Junction with Aluminium for Electrical and Optical Characterization," Materials Sciences and Applications, Vol. 2 No. 8, 2011, pp. 1022-1026. doi: 10.4236/msa.2011.28138.
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