JMP  Vol.2 No.7 , July 2011
On Radioactivity–Exposed Nanophotodetector Optoreliability
ABSTRACT
The optoelectronic reliability of representative radioactivity-exposed nanophotodetectors and the degree of functionally tolerable radioactivity-induced responsivity de-emphasis, against increasing cumulative radioactivity-dose, is notionally considered and modelled, with a view towards experimental findings concerning p-i-n photosensors being exposed to regulated successive (α, β)-particle bombardments.

Cite this paper
nullE. Anagnostakis, "On Radioactivity–Exposed Nanophotodetector Optoreliability," Journal of Modern Physics, Vol. 2 No. 7, 2011, pp. 766-770. doi: 10.4236/jmp.2011.27089.
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