JMP  Vol.6 No.13 , October 2015
Effect of Heat Treatment on the Nanoscale Structure and Optical Properties of Cd2SnO4 Thin Films Deposited by RF Magnetron Sputtering
ABSTRACT
Cadmium tin oxide Cd2SnO4 thin films with a thickness of 228.5 nm were prepared by RF magnetron sputtering technique on glass substrates at room temperature. AFM has been utilized to study the morphology of these films as a function of annealing temperature at the nanoscale. The optical properties of these films, such as the transmittance, T(λ), and reflectance, R(λ), have been studied as a function of annealing temperature. The optical constants, such as optical energy gap, width of the band tails of the localized states, refractive index, oscillatory energy, dispersion energy, real and imaginary parts of both dielectric constant and optical conductivity have been found to be affected by changing the annealing temperature of the films.

Cite this paper
Al-Baradi, A. (2015) Effect of Heat Treatment on the Nanoscale Structure and Optical Properties of Cd2SnO4 Thin Films Deposited by RF Magnetron Sputtering. Journal of Modern Physics, 6, 1803-1813. doi: 10.4236/jmp.2015.613184.
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http://dx.doi.org/10.1016/S0040-6090(96)08923-7

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http://dx.doi.org/10.1016/j.tsf.2005.01.097

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http://dx.doi.org/10.1103/PhysRev.93.632

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http://dx.doi.org/10.1088/0370-1301/67/10/306

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http://dx.doi.org/10.1140/epjb/e2007-00227-y

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http://dx.doi.org/10.1016/j.jcrysgro.2004.03.052

[42]   Shannon, R.D., Gillson, J.L. and Bouchard, R.J. (1977) Journal of Physics and Chemistry of Solids, 38, 877-881.
http://dx.doi.org/10.1016/0022-3697(77)90126-3

[43]   Omata, T., Ueda, N., Ueda, K. and Kawazoe, H. (1994) Applied Physics Letters, 64, 1077-1078.
http://dx.doi.org/10.1063/1.110937

[44]   Wu, X., Mulligan, W.P. and Coutts, T.J. (1996) Thin Solid Films, 286, 274-276.
http://dx.doi.org/10.1016/S0040-6090(95)08527-0

[45]   Coutts, T.J., Young, D.L., Li, X., Mulligan, W.P. and Wu, X. (2000) Journal of Vacuum Science & Technology A, 18, 2646-2660.
http://dx.doi.org/10.1116/1.1290371

[46]   Wu, X., Dhere, R.G., Albin, D.S., Gessert, T.A., Dehart, C., Keane, J.C. and Sheldon, P. (2001) High-Efficiency CTO/ ZTO/CdS/CdTe Polycrystalline Thin-Film Solar Cells. Proceedings of NCPV Program Review Meeting, 47.

[47]   Jayakrishnan, R. andHodes, G. (2003) Thin Solid Films, 440, 19-25.
http://dx.doi.org/10.1016/S0040-6090(03)00811-3

[48]   Biswas, P.K., De, A., Pramanik, N.C., Chakraborty, P.K., Ortner, K., Hock, V. and Korder, S. (2003) Materials Letters, 57, 2326-2332.
http://dx.doi.org/10.1016/S0167-577X(02)01220-X

[49]   Yamamoto, S., Yamanaka, T. and Ueda, Z. (1987) Journal of Vacuum Science & Technology A, 5, 1952-1955.
http://dx.doi.org/10.1116/1.574889

[50]   Kobayashi, H., Mori, H., Ishida, T. and Nakato, Y. (1995) Journal of Applied Physics, 77, 1301-1307.
http://dx.doi.org/10.1063/1.358932

[51]   Pla, J., Tamasi, M., Rizzoli, R., Losurdo, M., Centurioni, E., Summonte, C. and Rubinelli, F. (2003) Thin Solid Films, 425, 185-192.
http://dx.doi.org/10.1016/S0040-6090(02)01143-4

[52]   Togashi, S. (1992) Optoelectronics—Devices and Technologies, 7, 271.

[53]   Kawachi, G., Kimura, E., Wakui, Y., Konishi, N., Yamamoto, H., Matsukawa, Y. and Sasano, A. (1994) IEEE Transactions on Electron Devices, 41, 1120-1124.
http://dx.doi.org/10.1109/16.293338

[54]   Manifacier, J.C. (1982) Thin Solid Films, 90, 297-308.
http://dx.doi.org/10.1016/0040-6090(82)90381-9

[55]   Southwick, R.D., Wasylyk, J.S., Smay, G.L., Kepple, J.B., Smith, E.C. and Augustsson, B.O. (1981) Thin Solid Films, 77, 41-50.
http://dx.doi.org/10.1016/0040-6090(81)90358-8

[56]   Roos, A. (1991) Thin Solid Films, 203, 41-48.
http://dx.doi.org/10.1016/0040-6090(91)90514-X

[57]   Sberveglieri, G., Benussi, P., Coccoli, G., Groppelli, S. and Nelli, P. (1990) Thin Solid Films, 186, 349-360.
http://dx.doi.org/10.1016/0040-6090(90)90150-C

[58]   Matin, M.A., Jezierski, A.F., Bashar, S.A., Lacklison, D.E., Benson, T.M., Cheng, T.S. and Rezazadeh, A.A. (1994) Electronics Letters, 30, 318-320.
http://dx.doi.org/10.1049/el:19940243

[59]   Margalith, T., Buchinsky, O., Cohen, D.A., Abare, A.C., Hansen, M., DenBaars, S.P. and Coldren, L.A. (1999) Applied Physics Letters, 74, 3930-3932.
http://dx.doi.org/10.1063/1.124227

[60]   Chen, H.Y., Qiu, C.F., Wong, M. and Kwok, H.S. (2003) IEEE Electron Device Letters, 24, 315-317.
http://dx.doi.org/10.1109/LED.2003.812550

[61]   Pan, S.M., Tu, R.C., Fan, Y.M., Yeh, R.C. and Hsu, J.T. (2003) IEEE Photonics Technology Letters, 15, 649-651.
http://dx.doi.org/10.1109/LPT.2003.809985

[62]   Berger, P.R., Dutta, N.K., Zydzik, G., O’Bryan, H.M., Keller, U., Smith, P.R. and Cho, A.Y. (1992) Applied Physics Letters, 61, 1673-1675.
http://dx.doi.org/10.1063/1.108447

[63]   Chang, S.J., Lee, M.L., Sheu, J.K., Lai, W.C., Su, Y.K., Chang, C.S. and Tsai, J.M. (2003) IEEE Electron Device Letters, 24, 212-214.
http://dx.doi.org/10.1109/LED.2003.812147

[64]   Chopra, K.L., Major, S. and Pandya, D.K. (1983) Thin Solid Films, 102, 1-46.
http://dx.doi.org/10.1016/0040-6090(83)90256-0

[65]   Choi, Y.S., Lee, C.G. and Cho, S.M. (1996) Thin Solid Films, 289, 153-158.
http://dx.doi.org/10.1016/S0040-6090(96)08923-7

[66]   Stanimirova, T.J., Atanasov, P.A., Dimitrov, I.G. and Dikovska, A.O. (2005) Journal of Optoelectronics and Advanced Materials, 7, 1335-1340.

[67]   Al-Baradi, A.M., El-Nahass, M.M., El-Raheem, M.A., Atta, A.A. and Hassanien, A.M. (2014) Radiation Physics and Chemistry, 103, 227-233.
http://dx.doi.org/10.1016/j.radphyschem.2014.05.055

[68]   El-Nahass, M.M., Atta, A.A., El-Raheem, M.A. and Hassanien, A.M. (2014) Journal of Alloys and Compounds, 585, 1-6.
http://dx.doi.org/10.1016/j.jallcom.2013.09.079

[69]   Ali, H.M. (2005) Physicastatus Solidi (A), 202, 2742-2752.
http://dx.doi.org/10.1002/pssa.200521045

[70]   Mamazza, R., Morel, D.L. and Ferekides, C.S. (2005) Thin Solid Films, 484, 26-33.
http://dx.doi.org/10.1016/j.tsf.2005.01.097

[71]   Burstein, E. (1954) Physical Review, 93, 632-633.
http://dx.doi.org/10.1103/PhysRev.93.632

[72]   Moss, T.S. (1954) Proceedings of the Physical Society, Section B, 67, 775-782.
http://dx.doi.org/10.1088/0370-1301/67/10/306

[73]   Ali, H.M., El-Raheem, M.A., Megahed, N.M. and Mohamed, H.A. (2006) Journal of Physics and Chemistry of Solids, 67, 1823-1829.
http://dx.doi.org/10.1016/j.jpcs.2006.04.005

[74]   El-Raheem, M.A., Wakkad, M.M., Megahed, N.M., Ahmed, A.M., Shokr, E.K. and Dongol, M. (1996) Journal of Materials Science, 31, 5759-5764.
http://dx.doi.org/10.1007/BF01160825

[75]   Urbach, F. (1953) Physical Review, 92, 1324.
http://dx.doi.org/10.1103/PhysRev.92.1324

[76]   El-Raheem, M.A. (2007) Journal of Physics: Condensed Matter, 19, Article ID: 216209.
http://dx.doi.org/10.1088/0953-8984/19/21/216209

[77]   Vigil, O., Cruz, F., Morales-Acevedo, A., Contreras-Puente, G., Vaillant, L. and Santana, G. (2001) Materials Chemistry and Physics, 68, 249-252.
http://dx.doi.org/10.1016/S0254-0584(00)00358-8

[78]   Wemple, S.H. and DiDomenico Jr., M. (1971) Physical Review B, 3, 1338-1351.
http://dx.doi.org/10.1103/PhysRevB.3.1338

[79]   Wemple, S.H. (1973) Physical Review B, 7, 3767-3777.
http://dx.doi.org/10.1103/PhysRevB.7.3767

[80]   Caglar, Y., Ilican, S. and Caglar, M. (2007) The European Physical Journal B, 58, 251-256.
http://dx.doi.org/10.1140/epjb/e2007-00227-y

 
 
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