MR  Vol.2 No.4 , October 2014
Comparison of Chemical Elements on Carious & Normal Premolar’s Enamel Layers Using Energy Dispersive X Ray Spectrometer (X Ray-EDS)
ABSTRACT
Objectives: To compare the distribution of chemical elements among the carious and normal enamel layers on teenagers, using energy dispersive X ray spectrometer (EDS Rx). Materials and Methods: The EDS Rx analyzer is integrated to scanner electron microscope. The macro and mi-croelements were made in 30 premolars of teenager: 14 carious enamel layers and 16 normal enamel layers. Results: The quantitative and qualitative microanalyses of macro and microele-ments were found between the enamel layers of carious and normal premolar in term of variation and concentration expressed in percentage atomic weight. The statistical data analysis of ANOVA showed that the macroelements [C, Ca, P] and the microelements [Al, Cl, Mg, Na] were significantly different (P < 0.05) while, the macro [O] and the microelements [In, Si, W, S] were not significantly different (P < 0.05) among the carious and normal enamel layers. Moreover, the microelements Sb, Ba, Br, I, Ir, K, Pt, Sc, Sr, Sn and Yb were absent in carious enamel layers and present in normal enamel layers. Conclusion: The macro and microelements differ in composition and variation from the external to the internal enamel layers between the carious and the normal premolars. However, the deficiency or excess of these elements in the enamel layers determines the degree of susceptibility to carious and other dental disease. Clinical Relevance: The carious enamel in dental structure could be a major dental problem due to the deficiency or excess of macro and microele-ments which are responsible for secondary or recurrent caries, discoloration, pulpal inflammation, re-infection, abscess in jaw bone and dental disease.

Cite this paper
Ortiz, A. , Briano, M. , Esparza, M. and Juárez, J. (2014) Comparison of Chemical Elements on Carious & Normal Premolar’s Enamel Layers Using Energy Dispersive X Ray Spectrometer (X Ray-EDS). Microscopy Research, 2, 81-91. doi: 10.4236/mr.2014.24010.
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