Phase Identification Using Series of Selected Area Diffraction Patterns and Energy Dispersive Spectrometry within TEM
Author(s)
Kun-Lin Lin*
ABSTRACT
Transmission electron microscopy (TEM) is a very powerful technique for materials characteriza-tion, providing information relating to morphology, composition, and crystal structure. Selected area diffraction patterns (SADPs) are crystallographic data that can be obtained using a TEM in-strument. Conventional identification through SADP/TEM is tricky and tedious, thereby increasing the difficulty of phase identification. To establish a procedure for phase identification of known and unknown phases, in this study we examined two samples: one, a known phase, was Si with <100> alignment; the other, unknown, was the TixOy phase at the 96.4Au-3Ni-0.6Ti interlayer/ yttria-stabilized zirconia (YSZ) interface of a steel/96.4Au-3Ni-0.6Ti interlayer/YSZ joint. The procedures for phase identification of the known and unknown phases are described herein using a series of SADPs and energy dispersive spectrometry within TEM that would be useful for general researchers.
Transmission electron microscopy (TEM) is a very powerful technique for materials characteriza-tion, providing information relating to morphology, composition, and crystal structure. Selected area diffraction patterns (SADPs) are crystallographic data that can be obtained using a TEM in-strument. Conventional identification through SADP/TEM is tricky and tedious, thereby increasing the difficulty of phase identification. To establish a procedure for phase identification of known and unknown phases, in this study we examined two samples: one, a known phase, was Si with <100> alignment; the other, unknown, was the TixOy phase at the 96.4Au-3Ni-0.6Ti interlayer/ yttria-stabilized zirconia (YSZ) interface of a steel/96.4Au-3Ni-0.6Ti interlayer/YSZ joint. The procedures for phase identification of the known and unknown phases are described herein using a series of SADPs and energy dispersive spectrometry within TEM that would be useful for general researchers.
KEYWORDS
Phase Identification, Transmission Electron Microscopy, Selected Area Diffraction Pattern, Energy Dispersive Spectroscopy
Phase Identification, Transmission Electron Microscopy, Selected Area Diffraction Pattern, Energy Dispersive Spectroscopy
Cite this paper
Lin, K. (2014) Phase Identification Using Series of Selected Area Diffraction Patterns and Energy Dispersive Spectrometry within TEM. Microscopy Research, 2, 57-66. doi: 10.4236/mr.2014.24008.
Lin, K. (2014) Phase Identification Using Series of Selected Area Diffraction Patterns and Energy Dispersive Spectrometry within TEM. Microscopy Research, 2, 57-66. doi: 10.4236/mr.2014.24008.
References
[1] [1] Edington, J.W. (1974) Monographs in Practical Electron Microscopy in Materials Science. N. V. Philips, England. [2] [2] Williams, D.B. and Carter, C.B. (1996) Transmission Electron Microscopy. Plenum Press, New York, 267-287. http://dx.doi.org/10.1007/978-1-4757-2519-3 [3] [3] Fultz, B. and Howe, J. (2000) Transmission Electron Microscopy and Diffractometry of Materials. Springer, Berlin, 276-284. [4] [4] Thomas, G. and Goringe, M.J. (1979) Transmission Electron Microscopy of Materials. John Wiley & Sons, New York. [5] [5] Loretto, M.H. (1984) Electron Beam Analysis of Materials. Chapman & Hall, London. http://dx.doi.org/10.1007/978-94-009-5540-0 [6] [6] Lin, K.-L., Singh, M. and Asthana, R. (2014) Characterization of Yttria-Stabilized-Zirconia/Stainless Steel Joint Interfaces with Gold-Based Interlayers for Solid Oxide Fuel Cell Applications. Journal of the European Ceramic Society, 34, 355-372. http://dx.doi.org/10.1016/j.jeurceramsoc.2013.08.036
[1] [1] Edington, J.W. (1974) Monographs in Practical Electron Microscopy in Materials Science. N. V. Philips, England. [2] [2] Williams, D.B. and Carter, C.B. (1996) Transmission Electron Microscopy. Plenum Press, New York, 267-287. http://dx.doi.org/10.1007/978-1-4757-2519-3 [3] [3] Fultz, B. and Howe, J. (2000) Transmission Electron Microscopy and Diffractometry of Materials. Springer, Berlin, 276-284. [4] [4] Thomas, G. and Goringe, M.J. (1979) Transmission Electron Microscopy of Materials. John Wiley & Sons, New York. [5] [5] Loretto, M.H. (1984) Electron Beam Analysis of Materials. Chapman & Hall, London. http://dx.doi.org/10.1007/978-94-009-5540-0 [6] [6] Lin, K.-L., Singh, M. and Asthana, R. (2014) Characterization of Yttria-Stabilized-Zirconia/Stainless Steel Joint Interfaces with Gold-Based Interlayers for Solid Oxide Fuel Cell Applications. Journal of the European Ceramic Society, 34, 355-372. http://dx.doi.org/10.1016/j.jeurceramsoc.2013.08.036