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 MR  Vol.2 No.4 , October 2014
Phase Identification Using Series of Selected Area Diffraction Patterns and Energy Dispersive Spectrometry within TEM
Kun-Lin Lin*
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Abstract: Transmission electron microscopy (TEM) is a very powerful technique for materials characteriza-tion, providing information relating to morphology, composition, and crystal structure. Selected area diffraction patterns (SADPs) are crystallographic data that can be obtained using a TEM in-strument. Conventional identification through SADP/TEM is tricky and tedious, thereby increasing the difficulty of phase identification. To establish a procedure for phase identification of known and unknown phases, in this study we examined two samples: one, a known phase, was Si with <100> alignment; the other, unknown, was the TixOy phase at the 96.4Au-3Ni-0.6Ti interlayer/ yttria-stabilized zirconia (YSZ) interface of a steel/96.4Au-3Ni-0.6Ti interlayer/YSZ joint. The procedures for phase identification of the known and unknown phases are described herein using a series of SADPs and energy dispersive spectrometry within TEM that would be useful for general researchers.
Keywords: Phase Identification, Transmission Electron Microscopy, Selected Area Diffraction Pattern, Energy Dispersive Spectroscopy
Cite this paper: Lin, K. (2014) Phase Identification Using Series of Selected Area Diffraction Patterns and Energy Dispersive Spectrometry within TEM. Microscopy Research, 2, 57-66. doi: 10.4236/mr.2014.24008.
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