latch-up (SEL) is a significant issue for electronics design in space
application, which would cause large currents in electronic devices, and may
lead to burning out of devices. A new monitoring circuit based on
current-comparing method is designed to protect the electronics away from SEL’s
damage in radiation environment. The response time of protection circuit has
been analyzed. The signal simulation results indicated that the operating time
of the SEL protection circuit is dependent on the action time of current
comparator and system application recovery time. The function of the monitoring
circuit protection device away from SEL’s damage has validated through experiment
Cite this paper
Li, P. , Fu, X. , Luo, L. and Yu, Q. (2014) A New Analyzing Method of Single Event Latch-Up Protection Circuit Based on Current Comparing and Its Performance Verification. Journal of Modern Physics
, 387-393. doi: 10.4236/jmp.2014.56050
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