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 EPE  Vol.5 No.4 B , July 2013
Discussion of a Failure Hot-Spot Endurance Testing Case for CIGS Thin-Film Photovoltaic Module
Abstract: This paper describes the use of steady-state solar simulator for CIGS thin-film photovoltaic module hot-spot endurance test. In the study, not only are test procedures of hot-spot endurance test in IEC 61646 discussed, but also how to evaluate the performance of steady-state solar simulator by IEC 60904-9 is presented. Three CIGS thin-film PV modules with the same types are used for hot-spot endurance test in case study. It is found that some of the cell damages and visual defects on tested PV modules are clearly observed.
Cite this paper: A. Liu, S. Lai and J. Yeh, "Discussion of a Failure Hot-Spot Endurance Testing Case for CIGS Thin-Film Photovoltaic Module," Energy and Power Engineering, Vol. 5 No. 4, 2013, pp. 189-193. doi: 10.4236/epe.2013.54B036.
References

[1]   A. J. Breeze, “Next Generation Thin-film Solar Cells,” IEEE Conference on Reliability Physics Symposium (IRPS), 2008, pp. 168-171.

[2]   IEC 61646, “Thin-film Terrestrial Photovoltaic (PV) Modules – Design Qualification and Type Approval,” 2008.

[3]   M. Shimotomai, Y. Shinohara and S. Igari, “The Development of the I-V Measurement by Pulsed Multi-flash, and the Effectiveness,” IEEE Conference Photovoltaic Energy Conversion (WCPEC), Vol. 2, 2006, pp. 2223-2226.

[4]   IEC 60904-9, “Photovoltaic Devices - Part 9: Solar simulator Performance Requirements,” 2007.

[5]   IEC 60904-3, “Photovoltaic Devices - Part 3: Measurement Principles for Terrestrial Photovoltaic (PV) Solar Devices with Reference Spectral Irradiance Data,” 2008.

 
 
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