Back
 CN  Vol.5 No.3 C , September 2013
Pruned Volterra Models with Memory Effects for Nonlinear Power Amplifiers
Abstract: In this letter, a novel model is proposed for modeling the nonlinearity and memory effects of power amplifiers. The classical Volterra model is modified through a function of the sum of nonlinearity order with sum of memory length. The parameters of this model can be extracted in digital domain since the model is analyzed based on the envelope signals. The model we proposed enables a substantial reduction in the number of coefficients involved, and with excellent accuracy.
Cite this paper: Li, P. , Zhang, Q. , Wang, P. , Xie, Z. and Liu, B. (2013) Pruned Volterra Models with Memory Effects for Nonlinear Power Amplifiers. Communications and Network, 5, 570-572. doi: 10.4236/cn.2013.53B2102.
References

[1]   M. Schetzen, “The Volterra and Wiener Theories of Nonlinear Systems,” R. E. Krieger Publishing, Malabar, 1989.

[2]   V. J. Mathews and G. L. Sicuranza, “Polynomial Signal Processing,” John Wiley & Sons, New York, 2000.

[3]   C. P. Silva, et al, “Optimal-filter Approach for Nonlinear Power Amplifier Modeling and Equalization”, IEEE MTT-S International Microwave Symposium Digest, Boston, June 2000, pp. 437-440.

[4]   H. Ku, M. Mckinley and J. S. Kenney, “Quantifying Memory Effects in RF Power Amplifiers,” IEEE Transactions on Microw Theory and Tech, Vol. 50, No. 12, 2002, pp. 2843-2849. http://dx.doi.org/10.1109/TMTT.2002.805196

[5]   J. Kim and K. Konstantinou, “Digital Predistortion of Wideband Signals Based on Power Amplifier Model with Memory,” Electronics Letters, Vol. 37, No. 23, 2001, pp. 1417-1418. http://dx.doi.org/10.1049/el:20010940

[6]   A. Zhu, J. C. Pedro and T. R. Cunha, “Pruning the Volterra Series for Behavioral Modeling of Power Amplifiers Using Physical Knowledge,” IEEE Transactions on Microw Theory and Tech, Vol. 55, No. 5, 2007, pp. 813- 821.

[7]   C. Crespo-Cadenas, J. Reina-Tosina and M. J. Madero-Ayora, “Volterra Behavioral Model for Wideband RF Amplifiers,” IEEE Transactions on Microw Theory and Tech, Vol. 55, No. 5, 2007, pp. 449-457.

[8]   J. Vuolevi, T. Rahkonen and J. Manninen, “Measurement Technique for Characterizing Memory Effects in RF Power Amplifiers,” IEEE Transactions on Microw Theory and Tech, Vol. 49, 2001, pp. 1383-1389. http://dx.doi.org/10.1109/22.939917

 
 
Top