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 OPJ  Vol.3 No.4 , August 2013
AFM Analysis on Polymer Optical Micro-Resonators: Investigation on Quality Factor Origin
Abstract: This paper deals with the surface analysis of spherical polymeric optical micro-resonators in order to correlate surface defects with optical characteristics. Atomic force microscopy was used on structures to determine surface quality, which is the main origin of optical scattering losses. Surface morphologies were numerically treated to enable a relevant investigation on surface parameters such as root mean square (RMS) roughness (30.1 +/- 3.0 nm) or correlation length (few microns) necessary to express optical quality factors. A statistical analysis was conducted for calibration of these parameters as a function of cavities’ diameter. Results are in perfect agreement with spectral analyses performed in parallel on others structures. This comparison highlights the main role of scattering losses on quality factor origin.
Cite this paper: D. Pluchon, N. Huby, V. Vié, P. Panizza and B. Bêche, "AFM Analysis on Polymer Optical Micro-Resonators: Investigation on Quality Factor Origin," Optics and Photonics Journal, Vol. 3 No. 4, 2013, pp. 291-295. doi: 10.4236/opj.2013.34044.
References

[1]   P. Labbe, A. Donval, R. Hierle, E. Toussaere and J. Zyss, “Electro-Optic Polymer Based Devices and Technology for Optical Telecommunication,” Comptes Rendus Physique de l’Académie des Sciences, Vol. 3, No. 4, 2002, pp. 543-554.

[2]   F. Michelotti, A. Belardini, M. C. Larciprete, M. Bertolotti, A. Rousseau, A. Ratsimihety, G. Schoer and J. Muller, “Measurement of the Electro-Optic Properties of Poled Polymers at 1.55 Micron by Means of Sandwich Structures with Zinc Oxide Transparent Electrode,” Applied Physics Letters, Vol. 83, No. 22, 2003, pp. 4477-4480. doi:10.1063/1.1622798

[3]   B. Bêche, N. Pelletier, E. Gaviot and J. Zyss, “Single Mode TE00-TM00 Optical Waveguides on SU-8 Polymer,” Optics Communications, Vol. 230, No. 1-3, 2004, pp. 91-94. doi:10.1016/j.optcom.2003.11.016

[4]   F. Vollmer and S. Arnold, “Whispering-Gallery-Mode Biosensing: Label-Free Detection down to Single Molecules,” Nature Methods, Vol. 5, No. 7, 2008, pp. 591-596. doi:10.1038/nmeth.1221

[5]   A. Francois and M. Himmelhaus, “Optical Biosensor Based on Whispering Gallery Mode Excitations in Clusters of Microparticles,” Applied Physics Letters, Vol. 92, No. 14, 2008, pp. 141107-141110. doi:10.1063/1.2907491

[6]   P. Rabiei and W. H. Steier, “Polymer Microring Resonators,” World Scientific Publishing, Singapore, 2004, pp. 319-366.

[7]   A. B. Matsko, A. A. Savchenkov, V. S. Llchenko and L. Maleki, “Optical Gyroscope with Whispering Gallery Mode Optical Cavities,” Optics Communications, Vol. 233, No. 1-3, 2004, pp. 107-112. doi:10.1016/j.optcom.2004.01.035

[8]   N. Huby, D. Pluchon, N. Coulon, M. Belloul, A. Moreac, E. Gaviot, P. Panizza and B. Bêche, “Design of Organic 3D Microresonators with Microfluidics Coupled to Thin-Film Processes for Photonic Applications,” Optics Communications, Vol. 283, No. 11, 2010, pp. 2451-2456. doi:10.1016/j.optcom.2010.01.065

[9]   L. Collot, V. Lefèvre-Seguin, M. Brune, J. M. Raimond and S. Haroche, “Very High-Q Whispering-Gallery Mode Resonances Observed on Fused Silica Microspheres,” Europhysics Letters, Vol. 23, No. 5, 1993, pp. 327-334. doi:10.1209/0295-5075/23/5/005

[10]   D. W. Vernooy, V. S. Ilchenko, H. Mabuchi, E. W. Streed and H. J. Kimble, “High-Q Measurements of Fused-Silica Microspheres in the Near Infrared,” Optics Letters, Vol. 23, No. 4, 1998, pp. 247-249. doi:10.1364/OL.23.000247

[11]   M. Borselli, K. Srinivasan, P. E. Barclay and O. Painter, “Rayleigh Scattering, Mode Coupling, and Optical Loss in Silicon Microdisks,” Applied Physics Letters, Vol. 85, No. 17, 2004, pp. 3693-3695. doi:10.1063/1.1811378

[12]   I. M. White, N. M. Hanumegowda, H. Oveys and X. Fan, “Tuning Whispering Gallery Modes in Optical Microspheres with Chemical Etching,” Optics Express, Vol. 13, 2005, pp. 10754-10759. doi:10.1364/OPEX.13.010754

[13]   S. Jakobs, A. Duparré and H. Truckenbrodt, “AFM and Light Scattering Measurements of Optical Thin Films for Applications in the UV Spectral Region,” International Journal of Machine Tools and Manufacture, Vol. 38, No. 5-6, 1998, pp. 733-740. doi:10.1016/S0890-6955(97)00125-9

[14]   W. Z. Wang, H. Chen and Y.-Z. Hu, “Effect of Surface Roughness Parameters on Mixed Lubrication Characteristics,” Tribology International, Vol. 39, 2006, pp. 522-527. doi:10.1016/j.triboint.2005.03.018

[15]   M. L. Gorodetsky, A. A. Savchenkov and V. S. Ilchenko, “Ultimate Q of Optical Microsphere Resonators,” Optics Letters, Vol. 21, No. 7, 1996, pp. 453-455. doi:10.1364/OL.21.000453

[16]   R. Gavrila, A. Deniscu and D. Mardare, “A Power Spectral Density Study of Thin Films Morphology Based on AFM Profiling,” Romanian Journal of Information Science and Technology, Vol. 10, No. 3, 2007, pp. 233-241.

 
 
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