JSEMAT  Vol.3 No.3 , July 2013
Surface Characterisation of a Ferroelectric Single Crystal by Kelvin Probe Force Microscopy
ABSTRACT

We investigated the surface potential dynamics of a ferroelectric Pb(In1/2Nb1/2)O3-Pb(Mg1/3Nb2/3)O3-PbTiO3 (PIMNT) single crystal using Kelvin probe force microscopy (KPFM). The initial surface potential is a function of the applied bias since it reflects the interplay between the polarisation and screen charges. It is suggested that the different rates of tip injected charges are responsible for the asymmetric behaviour of the initial surface potential dependent on the sign of the applied bias. The polarisation, screen and tip injected charges are considered to explain the difference in surface potential dynamics.


Cite this paper
K. Lau, Y. Liu, Q. Li, Z. Li, R. Withers and Z. Xu, "Surface Characterisation of a Ferroelectric Single Crystal by Kelvin Probe Force Microscopy," Journal of Surface Engineered Materials and Advanced Technology, Vol. 3 No. 3, 2013, pp. 190-194. doi: 10.4236/jsemat.2013.33026.
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