AMPC  Vol.3 No.1 A , April 2013
High Resolution X-Ray Diffraction Analyses of (La,Sr)MnO3/ZnO/Sapphire(0001) Double Heteroepitaxial Films
ABSTRACT

The epitaxial relationships of lattices and crystalline qualities of LSMO/ZnO/sapphire double-hetero systems were thoroughly analyzed using X-ray diffraction techniques with a modern high resolution XRD system. It was revealed that the epitaxial growth of the LSMO (110) phase was promoted under higher temperature accompanying the suppression of other competitive growth of the LSMO (001) and (111) phases. Supplying the plasma oxygen accelerated the suppression of the LSMO (111) phase. The complex epitaxial orientational relationships in these three growth modes were revealed from the precise analyses with the high resolution out-of-plane XRD and the in-plane XRD measurements, pole figure measurements, and reciprocal space mappings measurements, as [112ˉ](111)LSMO//[11ˉ00](0001)ZnO//[112ˉ0](0001)Sap, [110ˉ](111LSMO)//[11ˉ00](0001)Zno//[112ˉ0](0001)Sap, and [110](001)LSMO//[11ˉ00](0001)Zno//[112ˉ0](0001)Sap. The validity of this model for the epitaxial orientational relationships in LSMO/ZnO/sapphire double heteroepitaxial layers was confirmed identically with the data ana- lyses of the out-of-plane wide-range Reciprocal Space Mapping using the 2-dimensional X-ray detector.


Cite this paper
K. Inaba, S. Kobayashi, K. Uehara, A. Okada, S. Reddy and T. Endo, "High Resolution X-Ray Diffraction Analyses of (La,Sr)MnO3/ZnO/Sapphire(0001) Double Heteroepitaxial Films," Advances in Materials Physics and Chemistry, Vol. 3 No. 1, 2013, pp. 72-89. doi: 10.4236/ampc.2013.31A010.
References
[1]   T. Endo, K. Uehara, T. Yoshii, M. Yokura, H. Zhu, J. Nogues, J. Colino and K. Endo, “Peculiar Electric and Magnetic Properties of La(Ba)MnO3 Thin Films,” Transactions of Materials Research Society of Japan, 2010, pp. 65-76.

[2]   K. Lord, D. Hunter, T. M. Williams and A. K. Paradhan, “Photocarrier Injection Effect and p-n Junction Characteristics of La0.7Sr0.3MnO3/ZnO and Si Heterostructures,” Applied Physics Letters, Vol. 89, No. 5, 2008, Article ID: 052116. doi:10.1063/1.2335406

[3]   V. Bhosle and J. Narayan, “Epitaxial Growth and Magnetic Properties of La0.7Sr0.3MnO3 Films on (0001) Sapphire,” Applied Physics Letters, Vol. 90, 2007, Article ID: 101903.

[4]   K. Uehara, A. Okada, A. Okamoto, M. Yokura, S. L. Reddy, S. Kobayashi, K. Inaba, N. Iwata, R. Philip, H. Kezuka, M. Matsui and T. Endo, “Hetero-Epitaxial Growth of Cubic La(Sr)MnO3 on Hexagonal ZnO, In-Plane Orientations of La(Sr)MnO3 (001), (110), and (111) Phases,” Japanese Journal of Applied Physics, Vol. 51, 2012, Artile ID: 11PG07.

[5]   K. Inaba, “X-Ray Thin-Film Measurement Techniques I. Overview,” The Rigaku Journal, Vol. 24, No. 1, 2008, pp. 10-15.

[6]   P. F. Fewster, “X-Ray Scattering from Semiconductors,” Imperial College Press, 2000.

[7]   T. Konya, “X-Ray Thin-Film Measurement Techniques III. High Resolution X-Ray Diffractometry,” The Rigaku Journal, Vol. 25, No. 2, 2009, pp. 1-8.

[8]   K. Omote and J. Harada, “Grazing-Incidence X-Ray Diffractometer for Determining In-Plane Structure of Thin Films,” Advances in X-Ray Analysis, Vol. 43, 2000, pp. 192-200.

[9]   S. Matsuno, M. Kuba, T. Nayuki, S. Soga and P. W. T. Yuen, “Microstructural Characterization of Thin Films and Surfaces by a New Grazing Incident X-Ray Diffractometer,” The Rigaku Journal, Vol. 17, No. 2, 2000, pp. 36-44.

[10]   Y. F. Chen, S. K. Hong, H. J. Ko, V. Kirshner, H. Wenish, T. Yao, K. Inaba and Y. Segawa, “Effects of an Extremely Thin Buffer on Heteroepitaxy with Large Lattice Mismatch,” Applied Physics Letters, Vol. 78, No. 21, 2001, pp. 3352-3354. doi:10.1063/1.1373412

[11]   S. Kobayashi, “X-Ray Thin-Film Measurement Techniques IV. In-Plane Diffraction Measurements,” Rigaku Journal, Vol. 26, No. 1, 2010, pp. 3-11.

[12]   S. K. Han, D. C. Oh, J. H. Song, K. Inaba, T. Yao and S. K. Hong, “Lattice Deformation in a-Plane ZnO Films Grown on r-Plane Al2O3 Substrates Grown by Plasma- Assisted Molecular-Beam Epitaxy,” Applied Physics Express, Vol. 5, 2012, Article ID: 081101. doi:10.1143/APEX.5.081101

[13]   K. Nagao and E. Kagami, “X-Ray Thin-Film Measurement Techniques VII. Pole Figure Measurement,” Rigaku Journal, Vol. 27, No. 2, 2011, pp. 6-14.

[14]   S. Kobayashi and K. Inaba, “X-Ray Thin-Film Measurement Techniques VIII. Detectors and Series Summary,” Rigaku Journal, Vol. 28, No. 1, 2012, pp. 8-13.

[15]   M. Renninger, “Beitrag zur Kenntnis der Roentgenorgraphischen Unterschiede Zwischen den Beiden Diamant- Typen,”Acta Crystallographica, Vol. 8, 1955, pp. 606- 610. doi:10.1107/S0365110X55001928

[16]   M. Seki, T. Konya, K. Inaba and H. Tabata, “Epitaxial Thin Films of InFe2O4 and InFeO3 with Two-Dimensional Triangular Lattice Structures Grown by Pulsed Laser Deposition,” Applied Physics Express, Vol. 3, 2010, Article ID: 105801. doi:10.1143/APEX.3.105801

[17]   G. Saint-Girons, C. Priester, P. Regreny, G. Patriarche, L. Largeau, V. Favre-Nicolin, G. Xu, Y. Robach, M. Gendry and G. Hollinger, “Spontaneous Compliance of the InP/ SrTiO3 Heterointerface,” Applied Physics Letters, Vol. 92, No. 24, 2008, Article ID: 241907. doi:10.1063/1.2944140

[18]   K. Dovidenko, S. Oktyabrsky, A. K. Sharma and J. Narayan, “TEM Characterization of ZnO and AlN/ZnO Thin Films Grown on Sapphire,” Materials Research Society Symposium Proceedings, Vol. 526, 1998, pp. 311-316. doi:10.1557/PROC-526-311

[19]   B. Wessler, F. F. Lange and W. Mader, “Textured ZnO Thin Films on (0001) Sapphire Produced by Chemical Solution Deposition,” Journal of Materials Research, Vol. 17, No. 7, 2002, pp. 1644-1650. doi:10.1557/JMR.2002.0242

[20]   M. Birkholz, “Thin Film Analysis by X-Ray Scattering,” Wiley-VCH Verlag GmbH & Co., 2006.

 
 
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