Study of Surface and Subsurface Defects in Materials by Photothermal Deflection Technique: Theory and Experience
ABSTRACT
Photothermal deflection is widely used to study defects in materials. Both high spatial resolution and high sensitivity are required to detect them. In order to improve the theoretical model in the case of uniform heating (one dimensional heat treatment) we have chosen to heat the sample by a halogen lamp. The sample which contains a known surface and subsurface defects is first covered by a thin graphite layer and placed in air. The sample fixed on a vertical holder is able to move in the x and y directions thanks a two stepper motors. The measurement showed excellent agreement between experimental and simulation results.
Cite this paper
A. Dhouib, A. Hamdi and N. Yacoubi, "Study of Surface and Subsurface Defects in Materials by Photothermal Deflection Technique: Theory and Experience," Journal of Modern Physics, Vol. 4 No. 3, 2013, pp. 380-384. doi: 10.4236/jmp.2013.43053.
A. Dhouib, A. Hamdi and N. Yacoubi, "Study of Surface and Subsurface Defects in Materials by Photothermal Deflection Technique: Theory and Experience," Journal of Modern Physics, Vol. 4 No. 3, 2013, pp. 380-384. doi: 10.4236/jmp.2013.43053.
References
[1] A. Rosencwaig, “Photoacoustics and Photoacoustic Spectroscopy,” Wiley Interscience, New York, 1980, pp. 170 and 295 [2] Y. H. Wong, R. L. Thomas and G. F. Hawkins, “Subsurface Structures of Solids by Scanning Photoacoustic Microscopy,” Applied Physics Letters, Vol. 35, No. 5, 1979, pp. 368-369. doi:10.1063/1.91153 [3] P. E. Nordal and S. O. Kanstad, “Photothermal Radiometry,” Physica Scripta, Vol. 20, No. 5-6, 1979, p. 659. doi:10.1088/0031-8949/20/5-6/020 [4] A. Rosencwaig and G. Busse, “High-Resolution Photoacoustic Thermal-Wave Microscopy,” Applied Physics Letters, Vol. 36, No. 9, 1980, pp. 725-727. doi:10.1063/1.91646 [5] A. C. Boccara, D. Fournier and J. Badoz, “Thermo-Optical Spectroscopy: Detection by the ‘Mirage Effect’,” Applied Physics Letters, Vol. 36, No. 2, 1980, pp. 130-132. doi:10.1063/1.91395 [6] J. C. Murphy and C. Aamodt, “Photothermal Spectroscopy Using Optical Beam Probing: Mirage Effect,” Journal of Applied Physics, Vol. 51, No. 9, 1980, pp. 4580-4588. doi:10.1063/1.328350 [7] R. Ritter and B. Schmitz, “Photothermal Inspections of Adhesion Strengths and Detection of Delaminations,” QIRT96-Eurotherm Series50-EdizioniETS, 1997 [8] J. L. Bodnar, M. EgCe, C. Menu, R. Besnard, A. Le Blanc, M. Pigeon and J. Y. Sellier, “Cracks Detection by a Moving Photothermal Probe,” Journal de Physique IV Colloque C7, Supplément au Journal de Physique 111, Vol. 4, 1994. [9] G. Imen, “Caractérisation Thermique et Optique des Matériaux Semi-Conducteurs par la Technique de Déflexion Photothermique,” Ph.D. Thesis, Faculté des Sciences de Tunis Université el Manar, 2011. [10] T. ghrib, N. Yacoubi and F. saadallah, “Simultaneous Determination of Thermal Conductivity and Diffusivity of Solid Samples Using the ‘Mirage Effect’ Method,” Sensors and Actuators, Vol. A135, No. 2, 2007, pp. 346-354. doi:10.1016/j.sna.2006.07.024
[1] A. Rosencwaig, “Photoacoustics and Photoacoustic Spectroscopy,” Wiley Interscience, New York, 1980, pp. 170 and 295 [2] Y. H. Wong, R. L. Thomas and G. F. Hawkins, “Subsurface Structures of Solids by Scanning Photoacoustic Microscopy,” Applied Physics Letters, Vol. 35, No. 5, 1979, pp. 368-369. doi:10.1063/1.91153 [3] P. E. Nordal and S. O. Kanstad, “Photothermal Radiometry,” Physica Scripta, Vol. 20, No. 5-6, 1979, p. 659. doi:10.1088/0031-8949/20/5-6/020 [4] A. Rosencwaig and G. Busse, “High-Resolution Photoacoustic Thermal-Wave Microscopy,” Applied Physics Letters, Vol. 36, No. 9, 1980, pp. 725-727. doi:10.1063/1.91646 [5] A. C. Boccara, D. Fournier and J. Badoz, “Thermo-Optical Spectroscopy: Detection by the ‘Mirage Effect’,” Applied Physics Letters, Vol. 36, No. 2, 1980, pp. 130-132. doi:10.1063/1.91395 [6] J. C. Murphy and C. Aamodt, “Photothermal Spectroscopy Using Optical Beam Probing: Mirage Effect,” Journal of Applied Physics, Vol. 51, No. 9, 1980, pp. 4580-4588. doi:10.1063/1.328350 [7] R. Ritter and B. Schmitz, “Photothermal Inspections of Adhesion Strengths and Detection of Delaminations,” QIRT96-Eurotherm Series50-EdizioniETS, 1997 [8] J. L. Bodnar, M. EgCe, C. Menu, R. Besnard, A. Le Blanc, M. Pigeon and J. Y. Sellier, “Cracks Detection by a Moving Photothermal Probe,” Journal de Physique IV Colloque C7, Supplément au Journal de Physique 111, Vol. 4, 1994. [9] G. Imen, “Caractérisation Thermique et Optique des Matériaux Semi-Conducteurs par la Technique de Déflexion Photothermique,” Ph.D. Thesis, Faculté des Sciences de Tunis Université el Manar, 2011. [10] T. ghrib, N. Yacoubi and F. saadallah, “Simultaneous Determination of Thermal Conductivity and Diffusivity of Solid Samples Using the ‘Mirage Effect’ Method,” Sensors and Actuators, Vol. A135, No. 2, 2007, pp. 346-354. doi:10.1016/j.sna.2006.07.024