Thin films of Cobalt(II) Oxide were deposited from
equimolar concentrations of Cobalt Chloride, and Hexamethylenetetramine on
clean glass substrates using the Aqueous Chemical Growth method in order to
determine the effect of precursor concentration on their optical and solid
state properties. The analytical tools used for the study include, Rutherford
Back Scattering (RBS) spectroscopy for elemental analysis and determination of
film thickness, X-Ray Difftraction (XRD) for crystallographic structure, a
UV-VIS spectrophotometer for optical and other solid state properties and a
photomicroscope for photomicrographs. The results indicate that an increase in
the concentration of precursor materials makes ACG CoO thin film a better
absorber of ultraviolet radiation, a better transmitter of infra-red radiation,
a reflector of visible radiation and a material having an increased band gap.
The ACG CoO thin film deposited from 0.1 M
precursor concentration was found to be a suitable material for the
construction of thermographic devices, poultry houses etc. It can also serve as
window layer in solar cells among other optoelectronic applications.
Cite this paper
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