ABSTRACT Chalcogenide films find many applications in electronics as memory device, laser writer &
xerography. To tailor the property to the requirement, various compositions of Cd, Te and Se
have been deposited and characterized optically. Films have been deposited by thermal
evaporation as well as by electron beam evaporation. Thermal analysis such as TGA, DTA and
DSC has been carried out before deposition to ensure the composition. Dependence of Eg on the
composition has been justified from (T% data) Transmittance measurements. Drastic changes in
optical property due to annealing in the range 200°C to 400°C have been investigated.
Cite this paper
T. Rajakumar, C. Sanjeeviraja and R. Chandramani, "Spectro-Structural Characterization of Chalcogenide Films Containing Cd, Te and Se," Journal of Minerals and Materials Characterization and Engineering, Vol. 10 No. 11, 2011, pp. 1051-1060. doi: 10.4236/jmmce.2011.1011080.
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