Study and Analysis of Defect Amplification Index in Technology Variant Business Application Development through Fault Injection Patterns
Affiliation(s)
Trimentus Technologies, Chennai, India. Mahendra Engineering College, Namakkal, India. Anna University, Coimbatore, India..
Trimentus Technologies, Chennai, India. Mahendra Engineering College, Namakkal, India. Anna University, Coimbatore, India..
ABSTRACT
Software reliability for business applications is becoming a topic of interest in the IT community. An effective method to validate and understand defect behaviour in a software application is Fault Injection. Fault injection involves the deliberate insertion of faults or errors into software in order to determine its response and to study its behaviour. Fault Injection Modeling has demonstrated to be an effective method for study and analysis of defect response, validating fault-tolerant systems, and understanding systems behaviour in the presence of injected faults. The objectives of this study are to measure and analyze defect leakage; Amplification Index (AI) of errors and examine “Domino” effect of defects leaked into subsequent Software Development Life Cycle phases in a business application. The approach endeavour to demonstrate the phasewise impact of leaked defects, through causal analysis and quantitative analysis of defects leakage and amplification index patterns in system built using technology variants (C#, VB 6.0, Java).
Software reliability for business applications is becoming a topic of interest in the IT community. An effective method to validate and understand defect behaviour in a software application is Fault Injection. Fault injection involves the deliberate insertion of faults or errors into software in order to determine its response and to study its behaviour. Fault Injection Modeling has demonstrated to be an effective method for study and analysis of defect response, validating fault-tolerant systems, and understanding systems behaviour in the presence of injected faults. The objectives of this study are to measure and analyze defect leakage; Amplification Index (AI) of errors and examine “Domino” effect of defects leaked into subsequent Software Development Life Cycle phases in a business application. The approach endeavour to demonstrate the phasewise impact of leaked defects, through causal analysis and quantitative analysis of defects leakage and amplification index patterns in system built using technology variants (C#, VB 6.0, Java).
Cite this paper
nullP. Shareef, M. Srinath and S. Balasubramanian, "Study and Analysis of Defect Amplification Index in Technology Variant Business Application Development through Fault Injection Patterns," Journal of Software Engineering and Applications, Vol. 3 No. 4, 2010, pp. 364-373. doi: 10.4236/jsea.2010.34041.
nullP. Shareef, M. Srinath and S. Balasubramanian, "Study and Analysis of Defect Amplification Index in Technology Variant Business Application Development through Fault Injection Patterns," Journal of Software Engineering and Applications, Vol. 3 No. 4, 2010, pp. 364-373. doi: 10.4236/jsea.2010.34041.
References
[1] A. Hall, “Seven Myths of Formal Methods,” IEEE Soft-ware, September 1990, pp. 11-19. [2] C. B. Jones, “Systematic Software Development Using VDM,” Prentice-Hall International, London, 1986. [3] S. J. Garland, J. V. Guttag and J. J. Horning. “Debugging Larch Shared Language Specifications,” IEEE Transac-tions on Software Engineering, September 1990, pp. 1044-1057. [4] W. Howden, “A Functional Approach to Program Testing and Analysis,” IEEE Transactions on Software Engi-neering, October 1986, pp. 997-1005. [5] L. J. White, “Basic mathematical Definitions and Results in Testing,” In: B. Chandrasekaran and S. Radicchi, Ed., Computer Program Testing, North-Holland, 1981, pp. 13-24. [6] R. DeMillo, R. Lipton and A. Perlis, “Social Processes and Proofs of Theorems and Programs,” Communications of the ACM, May 1979, pp. 803-820. [7] B. W. Johnson, “Design and Analysis of Fault-Tolerant Digital Systems,” Addison-Wesley, Massachusetts, 1989. [8] D. Dreilinger and L. J. Lin, “Using Fault Injection to Test Software Recovery Code,” November 1995. [9] N. G. M. Leme, E. Martins and C. M. F. Rubira, “A Software Fault Injection Pattern System,” Proceedings of the 9th Brazilian Symposium on Fault-Tolerant Compu-ting, Florianópolis, 5-7 March 2001, pp. 99-113.
[1] A. Hall, “Seven Myths of Formal Methods,” IEEE Soft-ware, September 1990, pp. 11-19. [2] C. B. Jones, “Systematic Software Development Using VDM,” Prentice-Hall International, London, 1986. [3] S. J. Garland, J. V. Guttag and J. J. Horning. “Debugging Larch Shared Language Specifications,” IEEE Transac-tions on Software Engineering, September 1990, pp. 1044-1057. [4] W. Howden, “A Functional Approach to Program Testing and Analysis,” IEEE Transactions on Software Engi-neering, October 1986, pp. 997-1005. [5] L. J. White, “Basic mathematical Definitions and Results in Testing,” In: B. Chandrasekaran and S. Radicchi, Ed., Computer Program Testing, North-Holland, 1981, pp. 13-24. [6] R. DeMillo, R. Lipton and A. Perlis, “Social Processes and Proofs of Theorems and Programs,” Communications of the ACM, May 1979, pp. 803-820. [7] B. W. Johnson, “Design and Analysis of Fault-Tolerant Digital Systems,” Addison-Wesley, Massachusetts, 1989. [8] D. Dreilinger and L. J. Lin, “Using Fault Injection to Test Software Recovery Code,” November 1995. [9] N. G. M. Leme, E. Martins and C. M. F. Rubira, “A Software Fault Injection Pattern System,” Proceedings of the 9th Brazilian Symposium on Fault-Tolerant Compu-ting, Florianópolis, 5-7 March 2001, pp. 99-113.