JAMP  Vol.8 No.11 , November 2020
Investigating the Thermal Stress of Millisecond Pulsed Laser Irradiation on Charge-Coupled Devices
In this study, a two-dimensional model describing thermal stress on a charge-coupled device (CCD) induced by ms laser pulses was examined. Considering the nonlinearity of the CCD’s material parameters and the melting phase transition process of aluminum electrode materials was considered by using equivalent specific heat capacity method, the physical process where a laser pulse irradiating a CCD pixel array was simulated using COMSOL Multiphysics software. The temperature field and thermal stress field were calculated and analyzed. In order to clarify the mechanism producing damage on the CCD detector, Raman spectra from silicon were measured with a micro-Raman spectrometer to determine stress change in the CCD chip. The procedure presented herein illustrates a method for evaluating strain in a CCD after laser irradiation.
Cite this paper: Jiang, C. , Tan, Y. , Peng, B. , Jin, G. , Cai, H. , Lv, Z. (2020) Investigating the Thermal Stress of Millisecond Pulsed Laser Irradiation on Charge-Coupled Devices. Journal of Applied Mathematics and Physics, 8, 2557-2568. doi: 10.4236/jamp.2020.811191.

[1]   Research Group of Strategic Research on China’s Laser Technology and Its Application by 2035 (2020) Strategic Research on China’s Laser Technology and Its Application by 2035. Strategic Study of CAE, 22 1-6.

[2]   He, X., Zhou, B., Liu, H.X. and Liu, X.S. (2019) Research Status of Laser Suppression Interference Assessment. Laser and Infrared, 49, 787-793.

[3]   Li, Y.D., Wen, L., Huang, J.Y., Wen, Y., Zhang, K.K. and Guo, Q. (2019) On Orbit Radiation Effect Analysis of Space Debris Detection Satellite Imaging CCD. Journal of Remote Sensing, 1, 116-124.

[4]   Meng, Q.L., Yang, T., Yu, Z., Zhao, Z.M., Zhao, Y. and Yu, F. (2020) Transient Numerical Simulation and on Orbit Verification of Loop Heat Pipe for Space Remote Sensor. Journal of Beijing University of Aeronautics and Astronautics, 1, 16.

[5]   Li, Z.W., Wang, X., Shen, Z.H., Lu, J. and Ni, X.W. (2015) Mechanisms for the Millisecond Laser-Induced Functional Damage to Silicon Charge-Coupled Imaging Sensors. Applied Optics, 54, 378-388.

[6]   Bartoli, F.J. (1975) Thermal Recovery Processes in Laser Irradiated HgCdTe (PC) Detectors. Applied Optics, 14.

[7]   Liu, Z.J., Lu, Q.S., Jiang, Z.P. and Zhao, Y.J. (1994) Study If Damage Effect in CCD Detectors Irradiated Locally by Laser. Laser Technology, 12, 344-347.

[8]   Ye, Y., Tan, Y. and Jin, G.Y. (2019) Accurate Measurement for Damage Evolution of Ceramics Caused by Nanosecond Laser Pulses with Polarization Spectrum Imaging. Optics Express, 27, 16360-16368.

[9]   Wang, X.S. and Liu, R.B. (2019) Fast Recognition and Classification of Tetrazole Compounds Based on Laser-Induced Breakdown Spectroscopy and Raman Spectroscopy. Chinese Optics, 12, 888-896.

[10]   Men, Z.W. and Fang, W.H. (2010) Fluorescence Enhanced Stimulated Raman Scattering of Benzene by Rhodamine B. The Journal of Light Scattering, 2, 115-119.

[11]   Zhang, Y.A., Niu, C.H., Zhao, S. and Lv, Y. (2019) Study on Interference of Near-Infrared Laser to Charge-Coupled Device Detector. Laser Technology, 10.

[12]   Jiang, X.E., Wang, B., Liu, J. and Zhang, H.C. (2017) Effect of Pulse Durations on Laser Thermal Damage of Optical Thin Films. Laser & Infrared, 47, 32-36.

[13]   Bi, J., Zhang, X.H. and Ni, X.W. (2011) Mechanism for Long Pulse Laser-Induced Hard Damage to the MOS Pixel of CCD Image Sensor. Acta Physica Sinica, 60.

[14]   Li, X.L., Niu, C.H., Ma, M.Y. and Li, Y. (2016) Finite Element Simulation of Damage Characteristics of CCD Detectors under Single-Laser-Pulse Irradiation. Laser Technology, 40, 730-733.

[15]   Wu, D., Lv, Y. and Niu, C.H. (2019) Damage of CCD Detector by Multi-Pulse Laser. Applied Laser, 39, 333-339.

[16]   Li, C. (2019) The Researches on Damage Mechanisms of Nanosecond/Continuous Laser Irradiation on CCD Detector. Changchun University of Science and Technology.

[17]   Li, Y.J., Liu, X.L., Sun, B.B. and Meng, D.D. (2020) Experimental Study on the Jamming and Damage of Image Sensors by Picosecond Laser. Chinese Journal of Lasers, 5, 70258-7025

[18]   Shao, J.F., Guo, J., Wang, T.F., et al. (2017) Damage Accumulation Effects of Multiple Laser Pulses Irradiated on Charged Coupled Device. Infrared and Laser Engineering, 46, 1003002-1003006.

[19]   Jiang, N., Zhang, C., Niu, Y.X., Shen, X.J., Yang, H.L., Chen, Y., Wang, L. and Zhang, B. (2008) Numerical Simulation of Pulsed Laser Induced Damage on CCD Arrays. Laser & Infrared, 38, 1004-1011.

[20]   Tan, Y., Cai, H.X., Sun, X.P., Gao, X. and Zhang, X.H. (2013) Stress- and Polarization-Induced Stimulated Raman Scattering in Optical Fiber. Laser Phys. Lett, 10.

[21]   De Wolf, I. (2003) Raman Spectroscopy: About Chips and Stress. Spectroscopy Europe, 15.

[22]   Chen, Y.B., Lu, J., Ni, X.W., Bi, J. and Zhang, X.H. (2008) Plastic Penetration during Laser Heating of a Metal Plate. Science Direct, 205, 9-15.

[23]   Sarau, G., Becker, M., Christiansen, G. and Christiansen, S. (2008) Residual Stress Measurements in Multicrystalline Silicon Bulk and Thin Film Solar Cells Using Micro-Raman Spectroscopy. 23rd European Photovoltaic Solar Energy Conference, 9, 1-5.