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Journal of Materials Science and Chemical Engineering
ISSN Online: 2327-6053
Google-based IF: 0.93  Citations h5-index & Ranking*
Submission
Volume 1, Number 5 A , October 2013
Cover Page, Table of Contents and Others: PDF (1787kb)
Detailed Micro Raman Spectroscopy Analysis of Doped Silicon Thin Film Layers and Its Feasibility for Heterojunction Silicon Wafer Solar Cells
Z. P. Ling, J. Ge, R. Stangl, A. G. Aberle, T. Mueller

J. Mater. Sci. Chem. Eng. Vol.1 No.5 A, October 17, 2013
DOI:10.4236/msce.2013.15A001

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