Detailed Micro Raman Spectroscopy Analysis of Doped Silicon Thin Film Layers and Its Feasibility for Heterojunction Silicon Wafer Solar Cells
Z. P. Ling, J. Ge, R. Stangl, A. G. Aberle, T. Mueller

J. Mater. Sci. Chem. Eng. Vol.1 No.5 A, October 17, 2013
DOI:10.4236/msce.2013.15A001