Atomic Force Microscopy Studies on GaAs/In Bilayers Deposited on Si (100)
Miguel Ángel Venegas, Roberto Bernal- Correa, Máximo López- López, Álvaro Pulzara- Mora

Microsc. Res. Vol.3 No.1, January 30, 2015
DOI:10.4236/mr.2015.31002

Bevel Tip Deformation in New and Used Dental Needles
César Gaitán- Fonseca, Denise Romo- Castillo, Bernardino Cerda- Cristerna, David Masuoka, Amaury Pozos- Guillén

Microsc. Res. Vol.3 No.1, January 14, 2015
DOI:10.4236/mr.2015.31001