Investigation and Comparison of the DIBL Parameter and Thermal Effects of SOD Transistors and SOI Transistors and Improving Them with the Change of Their BOX Thicknesses
Nooshien Laderian, Arash Daghighi

J. Electron. Cooling. Therm. Control Vol.8 No.2, June 29, 2018
DOI:10.4236/jectc.2018.82002