| Editor-in-Chief |
| Prof. |
Yang-Hui He |
City University, UK |
| Editorial Board |
| Prof. |
Nikolai A. Sobolev |
Universidade de Aveiro, Portugal |
| Dr. |
Mohamed Abu-Shady |
Menoufia University, Egypt |
| Dr. |
Hamid Alemohammad |
Advanced Test and Automation Inc., Canada |
| Prof. |
Emad K. Al-Shakarchi |
Al-Nahrain University, Iraq |
| Prof. |
Tsao Chang |
Fudan University, China |
| Prof. |
Stephen Robert Cotanch |
NC State University, USA |
| Prof. |
Peter Chin Wan Fung |
University of Hong Kong, China |
| Prof. |
Ju Gao |
The University of Hong Kong, China |
| Dr. |
Sachin Goyal |
University of California, USA |
| Dr. |
Wei Guo |
Florida State University, USA |
| Prof. |
Haikel Jelassi |
National Center for Nuclear Science and Technology, Tunisia |
| Prof. |
Santosh Kumar Karn |
Dr. APJ Abdul Kalam Technical University, India |
| Prof. |
Christophe J. Muller |
University of Provence, France |
| Dr. |
Rada Novakovic |
National Research Council, Italy |
| Prof. |
Tongfei Qi |
University of Kentucky, USA |
| Prof. |
Mohammad Mehdi Rashidi |
University of Birmingham, UK |
| Dr. |
A. L. Roy Vellaisamy |
City University of Hong Kong, China |
| Prof. |
Yuan Wang |
University of California, Berkeley, USA |
| Prof. |
Peter H. Yoon |
University of Maryland, USA |
| Prof. |
Meishan Zhao |
University of Chicago, USA |
| Prof. |
Pavel Zhuravlev |
University of Maryland at College Park, USA |
