Prof. Antony J. Bourdillon

UHRL, San Jose, CA, USA

Professor (Retired)



1993 Ph.D., Thesis: Spectroscopy of ionic materials using synchrotron radiation

1968-1971 B.A., M.A., Honor School of Physics, Oxford University

Publications (Selected)

  1. A. J. Bourdillon, Complete solution for quasicrystals, Journal of Modern Physics, (2020) 11, 581-592. DOI:
  2. A.J. Bourdillon, Reduction of superconducting wave packets in dispersion dynamics, Journal of Modern Physics, 11 (2020) 365-377 DOI:
  3. A. J. Bourdillon, Wave harmonization in hierarchic quasicrystals by the analytic metric, Journal of Modern Physics, 10 (2019) 1364-1373, DOI:
  4. A. J. Bourdillon, The reciprocal lattice in hierarchic quasicrystals, Journal of Modern Physics 10 [6] 624-634 (2019), DOI:
  5. A. J. Bourdillon, Dispersion Dynamical magnetic radius in intrinsic spin equals the Compton wavelength, Journal of Modern Physics, special issue on Magnetic Field and Magnetic Theory, 9 [13] 2295-2307 (2018), DOI:
  6. A. J. Bourdillon, Many-body-gravitational solutions for galactic rotational velocities, including possible negative mass, Journal of Modern Physics 9 1304-1316 (2018), DOI:
  7. A. J. Bourdillon, Voids in the Hall effect; excitons in HiTc, Journal of Modern Physics 8, 483-499 (2017) DOI:
  8. A. J. Bourdillon, Optical response to submicron digital elements simulated by FDTD wavelets with refractive impulse, Advances in Optical Technologies, 2014 (2014) article ID 682614, 4 pages.
  9. A. J. Bourdillon and C.B. Boothroyd, Simulated aerial images from circular apertures using near field X-ray lithography, J. Phys. D: Applied Physics 38 2947-2951 (2005).
  10. A. J. Bourdillon and C. B. Boothroyd, Simulations for printing contacts with near field X-rays, J. Phys. D: Applied Physics 38 1-5 (2005).
  11. A. J. Bourdillon and C. B. Boothroyd, Proximity Correction Simulations in Ultra High Resolution X-ray Lithography, J. Phys. D: Appl. Phys., 34 3209-3213 (2001).
  12. A. J. Bourdillon, C. B. Boothroyd, J. R. Kong and Y. Vladimirsky, A Critical Condition in Fresnel Diffraction Used for Ultra-High Resolution Lithographic Printing, J. Phys. D: Appl. Phys. 33 1-9 (2000).
  13. N. X. Tan, E. Flores, R. Gopalakrishnan and A. J. Bourdillon, Surface Treatment and Analysis for Adhesion Enhancement in Advanced Organic IC Packaging, IEEE (1998).