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Shen, X.C. and Han, M. (2018) Improved S-box Based on Strict Avalanche Distance Criterion. Microelectronics & Computer, 35, 92-96.
https://chn.oversea.cnki.net/KCMS/detail/detail.aspx?dbcode=CJFD&dbname=CJFDLAST2018&filename=WXYJ201806020&uniplatform=OVERSEA&v=y8jwcNYZOk4NEvpQNzq689lZkTI8P8tEKPKjl4d94PoJ4RAsb8iS50lWFfAulS1X

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