AMPC  Vol.4 No.10 , October 2014
Investigation on the Effect of Film Thickness on the Surface Morphology, Electrical and Optical Properties of E-Beam Deposited Indium Tin Oxide (ITO) Thin Film
ABSTRACT

  The following article has been retracted due to the fact that the authors practise fraud. The scientific community takes a very strong view on this matter, and the Advances in Materials Physics and Chemistry treats all unethical behavior seriously. This paper published in Vol. 4 No. 10 194-202, 2014 has been removed from this site.

  Title: Investigation on the Effect of Film Thickness on the Surface Morphology, Electrical and Optical Properties of E-Beam Deposited Indium Tin Oxide (ITO) Thin Film

  Authors: Golam Saklayen, Shahinul Islam, Ferdous Rahman, Abu Bakar Ismail


Cite this paper
Saklayen, G. , Islam, S. , Rahman, F. and Ismail, A. (2014) Investigation on the Effect of Film Thickness on the Surface Morphology, Electrical and Optical Properties of E-Beam Deposited Indium Tin Oxide (ITO) Thin Film. Advances in Materials Physics and Chemistry, 4, 194-202. doi: 10.4236/ampc.2014.410023.
References
[1]   Zeyada, H.M., El-Nahass, M.M., El-Zawawi, I.K. and El-Menyawy, E.M. (2010) Characterization of 2-(2,3-dihydro-1,5-dimethyl-3-oxo-2-phenyl-1H-pyrazol-4-ylimino)-2-(4nitrophenyl)acetonitrile and ZnO Nano-Crystallite Structure Thin Films for Application in Solar Cells. The European Physical Journal, 49, 10301.

[2]   Kim, H., Piqué, A., Horwitz, J.S., et al. (1999) Indium Tin Oxide Thin Films for Organic Light-Emitting Devices. Applied Physics Letters, 74, 3444-3446.
http://dx.doi.org/10.1063/1.124122

[3]   Parker, D.G. and Say, P.G. (1986) Indium Tin Oxide/GaAs Photodiodes for Millimetric-Wave Applications. Electronics Letters, 22, 1266-1267.
http://dx.doi.org/10.1049/el:19860867

[4]   Pankove, J.I. (1980) Display Devices, Topics in Applied Physics. Springer, Berlin.
http://dx.doi.org/10.1007/3-540-09868-2

[5]   Kerkache, L., Layadi, A. and Mosser, A. (2009) Effect of Oxygen Partial Pressure on the Structural and Optical Properties of dc Sputtered ITO Thin Films. Journal of Alloys and Compounds, 485, 46-50.
http://dx.doi.org/10.1016/j.jallcom.2009.06.103

[6]   Guai, G.H., Song, Q.L., Lu, Z.S. and Li, C.-M. (2011) Effects of Multiple Heat Treatment Cycles on Structure, Optical and Electrical Properties of Indium-Tin-Oxide Thin Films. Surface and Coatings Technology, 205, 2852-2856.
http://dx.doi.org/10.1016/j.surfcoat.2010.10.062

[7]   Amaral, A., Brogueira, P., de Carvalho, C.N. and Lavareda, G. (2001) Influence of the Initial Layers on the Optical and Electrical Properties of ITO Films. Optical Materials, 17, 291-294.
http://dx.doi.org/10.1016/S0925-3467(01)00051-9

[8]   Kim, J.H., Ahn, B.D., Lee, C.H., et al. (2007) Enhancement in Electrical and Optical Properties of Indium Tin Oxide Thin Films Grown Using a Pulsed Laser Deposition at Room Temperature by Two-Step Process. Thin Solid Films, 515, 3580-3583.
http://dx.doi.org/10.1016/j.tsf.2006.11.006

[9]   Raoufi, D. (2009) Morphological Characterization of ITO Thin Films Surfaces. Applied Surface Science, 255, 3682-3686.
http://dx.doi.org/10.1016/j.apsusc.2008.10.020

[10]   Moholkar, A.V., Pawar, S.M., Rajpure, K.Y., Ganesan, V. and Bhosale, C.H. (2008) Effect of Precursor Concentration on the Properties of ITO Thin Films. Journal of Alloys and Compounds, 464, 387-392.
http://dx.doi.org/10.1016/j.jallcom.2007.09.138

[11]   Valencia, H.Y., Moreno, L.C. and Ardila, A.M. (2008) Structural, Electrical and Optical Analysis of ITO Thin Films Prepared by Sol-Gel. Microelectronics Journal, 39, 1356-1357.
http://dx.doi.org/10.1016/j.mejo.2008.01.036

[12]   E1-Menyawy, M.M. (2012) Thickness Dependence of Structural and Optical Indium Tin Oxide Nanofiber Thin Films Prepared by Electron Beam Evaporation onto Quartz Substrate. Materials Science and Engineering B, 177, 145-150.
http://dx.doi.org/10.1016/j.mseb.2011.10.018

[13]   Scott, G.D., McLauchlan, T.A. and Sennett, R.S. (1950) The Thickness Measurement of Thin Films by Multiple Beam Interferometry. Journal of Applied Physics, 21, 843.
http://dx.doi.org/10.1063/1.1699770

[14]   Kumar, K.J., Raju, N.R.C. and Subrahmanyam, A. (2011) Thickness Dependent Physical and Photocatalytic Properties of ITO Thin Films Prepared by Reactive DC Magnetron Sputtering. Applied Surface Science, 257, 3075-3080.
http://dx.doi.org/10.1016/j.apsusc.2010.10.119

[15]   Benoy, M.D., Mohammed, E.M., Suresh, B.M., Binu, P.J. and Pradeep, B. (2009) Thickness Dependence of the Properties of Indium Tin Oxide (ITO) FILMS Prepared by Activated Reactive Evaporation. Brazilian Journal of Physics, 39.

[16]   Banerjee, R., Ray, S. and Barua, A.K. (1987) Thickness Dependence of the Properties of Magnetron Sputtered Indium tin Oxide-Films. Journal of Materials Science Letters, 6, 1203.

[17]   Omar, O.A., Rigaie, H.F. and Fikry, W.F. (1990) Preparation of Sprayed Tin Oxide Transparent Conducting Films and Their Structural and Electricalproperties. The Journal of Materials Science: Materials in Electronics, 3, 79.

 
 
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